IOST3 2007 - Call for Presentations & Participation

CALL FOR PRESENTATIONS & PARTICIPATION

Overview -- Submissions -- Contact -- Committees

Overview

The background of this event is the continuing struggle with interoperability issues experienced in the flow and management of test data for semiconductor and system debug, diagnosis, yield learning, maintenance, and reliability.

Test is no longer the simple application of vectors to an IC or a board. Test has now expanded to include

Information gathering. We must collect information, not just for a particular device on a tester, but on trends and on the environment the device operates in, both in the system assembly factory and in the field.
Information sharing. Testing no longer takes place only within the walls of a company. We must share data with both vendors and customers, supply chain managers must understand vendor performance, and suppliers must collect field failure information from many customers in order to get a significant data sample to correct problems as quickly as possible.
Information analysis. We must be able to combine information from multiple sources, data mine it, and allow those with domain knowledge, rather than just database knowledge, to view it.

IOST3 provides a forum for the discussion of open source tools, open APIs, open databases and data architectures, and open processes to allow companies to more effectively use test information to improve quality and profitability.

Potential Presentation Topics

Open source tools for test generation, validation, analysis, and standards compliance testing.
Open source databases and open data architectures for storing test and performance data from multiple sources.
Database architectures that allow limited sharing of information while protecting proprietary information.
Visualization tools and data mining tools to access the data.
Open data collection processes for sharing information.
Open processes for unique identification of products and components across multiple companies, with traceability information.
Open APIs to allow collection of data from ATE, from other testers, and from systems under test in the factory and under test or in operation in the field.

Submissions

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To present at the Workshop, please submit an extended abstract of about 150 words by E-mail to the Program Chair – in addition, a URL to the relevant Open Source tool would be very useful, and brief laptop demos are encouraged. Each submission should include the full name of each author or other technical contributor, affiliation, telephone number and email address. Please also identify the presenter.

AUTHOR/PRESENTER SCHEDULE:

Submission: February 5, 2007
Presenter Notification: April 2, 2007
Presentation Upload: April 20, 2007

Contact

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General Information:

Burnie West, IOST3
Half Moon Bay, CA
Tel +1-510-364-3503
Email: west@ieee.org

Program Information:

Scott Davidson
Sun Microsystems
Sunnyvale, CA
Tel +1-408-720-4830
Email: scott.davidson@sun.com

Please visit our website at http://IOST3.org/

Committees

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Chair
Burnie West
IOST3, USA

Program Chair
Scott Davidson
Sun, USA

Program Co-Chair
Stephen Ho
Sun, USA

Finance Chair
Maddie Harwood
CEM, Inc.

Organizing Committee
Burnie West
IOST3, USA

Bill Eklow
Cisco, USA

Scott Davidson
Sun, USA

Stephen Ho
Sun, USA

Program Committee
Dwayne Burek
Magma, USA

Tapan Chakraborty
Lucent, USA

Bill Eklow
Cisco, USA

Scott Fetherston
Transmeta, USA

Larry Gilg
Die Products, USA

Jamil Khatib
OpenTech

Erik Jan Marinissen
NXP, Netherlands

Bruce Parnas
Advantest, USA

Janusz Rajski
Mentor Graphics, USA

Matteo Sonza Reorda
Politecnico di Torino, Italy

Gordon Roberts
McGill U, Canada

Gordon Robinson
USA

Paul Roddy
Advantest, USA

Tony Taylor
TaylorSTIL, USA

Nur Touba
Univ of Texas, USA

Erik Volkerink
Agilent, USA

Jim Webster
BAE Systems, USA

Shianling Wu
Syntest, USA

Zeljko Zilic
McGill U, Canada

For more information, visit us on the web at: http://IOST3.org/

The IOST3 - 2007: IEEE International Workshop on Open Source Test Technology Tools is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	IOST3 - 2007: IEEE INTERNATIONAL WORKSHOP on OPEN SOURCE TEST TECHNOLOGY TOOLS May 10-11, 2007 Berkeley, California Held in conjunction with IEEE VLSI Test Symposium (VTS-07) http://IOST3.org/